For large-area photovoltaic panels, complete battery modules, and small-to-medium-sized photovoltaic components, there have long been industry pain points such as small light spots in equipment, the need for multiple joint tests, large error accumulation, and low test efficiency. Conventional small-sized pulse simulators cannot cover the entire light exposure area of large-sized samples, and zone detection is prone to data deviations and poor batch consistency. Steady-state large-sized equipment continuously irradiation is prone to cause sample heat rise, resulting in temperature-sensitive battery efficiency drift and thermal damage mismeasurement, and is unable to meet the high-frequency, high-speed, no-heat, and high-precision production detection requirements of the production line, severely restricting the large-scale, standardized, and efficient production quality improvement of large-sized photovoltaic devices.
Deeply specializing in large-area photovoltaic precision detection and pulse light illumination simulation, Saifan Optoelectronics relies on ultra-large area compound eye uniform light optical technology, high-precision pulse xenon light spectrum fitting architecture, and millisecond-level flash stability control algorithm, and has launched a large-area 3A-level pulse solar light simulator. Strictly following the international authoritative standards of IEC 60904-9:2020 and ASTM E927, it achieves triple 3A top-level indicators of spectral matching, irradiation uniformity, and time stability coverage. With an ultra-large uniform irradiation area, instantaneous non-thermal pulse flash, full-area high-precision uniform light, and ultra-fast batch detection, it overcomes the core problems of large-scale photovoltaic sample joint test errors, thermal interference distortion, and low detection efficiency. It provides a compliant and traceable efficient pulse light illumination solution for large-scale photovoltaic enterprises' production grading, pilot process iteration, and large-area sample rapid calibration.
Triple 3A full-level compliance, large-scale certification-level test benchmark
The equipment is equipped with high-power short arc pulse xenon light source, combined with customized optical filtering and precise spectral coloration technology, achieving 3A top-level testing standards in all dimensions, fully meeting international photovoltaic detection specifications. The entire machine covers an ultra-wide full-spectrum continuous output of 300?1100nm, completely replicating the AM1.5G standard solar energy distribution, with spectral matching strictly controlled within the 0.875?1.125 standard range, full-band spectral fidelity exceeding 97%, and accurately adapting to the light response characteristics of all categories of large-sized photovoltaic devices, such as crystalline silicon, TOPCon, HJT, calcium phosphate, thin film, CIGS, etc., from the source to eliminate power misjudgment and data distortion caused by spectral ratio deviation, ensuring the accuracy and compliance of the performance calibration of large-area samples throughout.
Based on its self-developed ultra-large area all-area uniform light system, through multi-dimensional optical simulation optimization of the light path, the uniformity within the effective irradiation area of the large surface is ≤ ±3%, with no attenuation, no dark areas, no hotspots, and no gradient deviation of strength, achieving uniform light exposure for the entire large panel and complete component at one time; equipped with a high-speed pulse timing closed-loop control system, the single flash light intensity stability is excellent, and the batch repeated flash deviation is extremely low, stably meeting the 3A-level time stability standard. The test data can be directly compared with the requirements of TÜV and UL international certifications, and is suitable for authoritative quality inspection of large-sized components, batch process benchmarking, and scientific research data traceability in strict scenarios.
Pulse instantaneous non-thermal irradiation, eliminating sample thermal damage
Different from the inherent shortcomings of large-sized steady-state simulators, which have severe heat accumulation and temperature rise problems, this equipment adopts an ultra-short pulse flash working architecture, with millisecond-level instantaneous light emission and extremely short irradiation duration, completing photoelectric conversion of light energy quickly, without heat accumulation, no sample temperature rise interference, and no thermal stress damage. Completely solving the industry pain points of temperature-sensitive devices such as large-scale perovskite and thin film batteries caused by long-term irradiation, this equipment perfectly adapts to high-frequency batch detection, rapid cycle calibration, and no-thermal damage reliability screening scenarios for large-sized photovoltaic large panels, ensuring that each set of large-area sample test data is consistent with the real outdoor conditions.
The equipment does not require preheating, standby mode, or continuous energy consumption. A single flash can complete the collection of the complete I-V curve for large-sized samples. The testing efficiency is tens of times higher compared to steady-state equipment. At the same time, it avoids problems such as long-term thermal radiation-induced optical path deviation, optical component aging, and equipment performance degradation. The entire machine operates stably, has a low failure rate, and has a longer service life. It can perfectly adapt to large-scale production lines for all-day, uninterrupted, and high-frequency operations, balancing the ultimate testing accuracy of the research level with the efficient production rhythm of industrialization.
Integrated large-format forming, rapid and batch precision testing of large plates
The equipment is equipped with a customized ultra-large-sized uniform light module to achieve integrated uniform light spot output for large-format. It can completely cover the entire photovoltaic large plate, complete battery module, and small and medium-sized photovoltaic components in one flash, without the need for zone scanning or multiple joint tests. This eliminates the errors in alignment and regional testing deviations at the root, significantly improving the testing efficiency and batch data consistency of large-sized samples. It can quickly screen for local process unevenness, coating deviation, hidden defects, and regional response differences, accurately reflecting the subtle fluctuations of key processes such as diffusion, etching, and coating, providing precise data support for the optimization of large-scale photovoltaic production processes.
The equipment is broadly compatible with various large-sized photovoltaic test samples, covering large-sized single and multi-crystalline silicon cells, TOPCon/HJT high-efficiency cell large plates, wide-band thin-film photovoltaics, stack components, and small and medium-sized photovoltaic modules. It perfectly adapts to the full-scenario needs of large-scale new energy enterprises' mass production quality inspection, universities' large-scale material mechanism research, pilot process iterations, and third-party authoritative certification and testing. It is a benchmark equipment for efficient, precise, and non-thermal detection of large-sized photovoltaic devices.
Broadband pulse stabilization, fully automatic standardized efficient parameter measurement
Equipped with a dedicated intelligent control system from Sefan, it integrates one-click pulse triggering, automatic light intensity calibration, flash timing adaptive, high-speed collection of all-I-V curves, batch data archiving, standardized report output, and all intelligent functions for real-time dynamic correction of single-flash energy fluctuations, adaptive matching of large-sized sample testing parameters, and full avoidance of human operational errors, ensuring high consistency, repeatability, and traceability of test data for large-scale sample testing. It supports customizing flash frequency, irradiation intensity, test cycle times, and sampling accuracy. The irradiation intensity can be continuously adjusted within a wide range, suitable for standard calibration, low-light testing, and high-light overload conditions. It can seamlessly link with high-speed I-V testing systems, automatic loading and unloading mechanisms on the production line, EL defect detection modules, and precise displacement platforms to achieve integrated automatic operation for large-sized sample light simulation, performance testing, defect screening, and data classification, significantly reducing labor costs and adapting to industrialized large-scale, high-frequency, and standardized detection operations.
Modular expansion architecture, compatible with industrial mass production and high-end research
The equipment adopts an open modular design, with sufficient functional upgrade and customization interfaces, allowing for flexible adaptation to diversified high-end testing requirements. It can be expanded with ultra-large-sized light spot modules to adapt to larger-sized photovoltaic component testing; it can be paired with an automatic scanning Mapping module to complete the performance distribution testing of the entire large plate; it can be upgraded with a batch data analysis system to automatically calculate pass rates, power distribution, and process deviations; it can be expanded with the AM0 space spectrum module to adapt to large-scale aerospace photovoltaic device environment simulation testing, covering multiple levels of industrial mass production quality inspection, process optimization, and frontier scientific research characterization requirements. The equipment has a high reuse rate and strong adaptability.
Domestic precision self-developed, high-performance cost-effective alternative to imported equipment
The core pulse xenon lamp triggering unit, large-format uniform light optical system, and flash closed-loop stabilization algorithm are all independently developed and controllable. The uniformity of the large area, spectral accuracy, and batch flash stability are fully benchmarked against imported large-format 3A pulse simulators. At the same time, it thoroughly addresses the industry pain points of high-priced imported equipment, long delivery cycles, delayed after-sales response, poor adaptability for mass production, and high operation and maintenance costs. It possesses core advantages such as large-format integrated precision testing, non-thermal and non-destructive testing, ultra-fast batch detection, stable operation, low energy consumption, and no high-frequency maintenance. It precisely meets the core needs of domestic large-scale photovoltaic production lines for quality improvement and cost reduction, as well as efficient mass production.
The manufacturer provides on-site installation and commissioning, production line adaptation and connection, professional technical training, lifetime technical support, and personalized light spot customization one-stop services. It quickly adapts to various large-sized photovoltaic detection scenarios, significantly reduces the procurement and production operation and maintenance costs of enterprises, helps to replace large-format pulsed photovoltaic detection equipment with domestic products, and empowers the photovoltaic industry to achieve large-scale, efficient, and standardized upgrades.
Steady and fast detection for large panels, empowering the quality improvement and efficiency enhancement of large-scale photovoltaic industries
The large-scale precise quality inspection of photovoltaic devices relies on uniform, ultra-fast, non-thermal, and stable compliance standard light support. The Sefan large-format 3A-level pulsed solar light simulator, with triple 3A top-level precision, super large integrated irradiation area, instantaneous non-thermal pulse technology, efficient batch detection, intelligent and simple measurement and control, fully covers all scenarios of mass production grading, batch quality inspection, process iteration, and scientific research characterization of large-sized photovoltaic large panels, modules, and components, providing solid and reliable ultra-fast standard light support for the industrialization and large-scale production of new energy, as well as precise quality control and management.