In the research and testing of perovskite cells, organic optoelectronic devices, thin-film semiconductors, and two-dimensional materials, many experimental personnel encounter challenges: the pressure of the ordinary removable probe holder is uncontrollable. Excessive pressure can puncture the thin-film electrodes, while insufficient pressure can cause false connections. The I-V curves drift and the data have poor repeatability. Repeated adjustments consume a lot of research time. The Sevan Optoelectronics 7-SCF02 removable probe holder, based on the 7-SCF01, upgrades the adjustable probe contact pressure structure, balancing the convenience of free placement with the controllability of contact pressure. It provides a reliable solution for high-precision electrical characterization.

The 7-SCF02 continues the removable design, does not require screw fixation for installation, and can be directly placed on the optical platform or sample table for testing. During multi-probe joint testing, multiple probe holder positions can be freely moved, and the probe points can be flexibly arranged without changing the sample table base. It can quickly adapt to large-sized samples, irregular devices, and scattered electrode points, significantly reducing the time for system setup and position alignment, and is compatible with the rapid establishment of test links in the laboratory.

The core upgrade lies in the independent pressure fine-tuning mechanism, which no longer relies entirely on self-weight compression. The probe's downward pressure for contact can be precisely controlled through a regulating knob. For samples that are easily damaged, such as perovskite films, ultra-thin electrodes, and flexible devices, the pressure can be adjusted to a gentle range to avoid the probe puncturing the film or scratching the electrode; for samples with surface oxidation or excessive contact impedance, the contact pressure can be moderately increased to eliminate false connections and reduce contact resistance, obtaining stable and repeatable electrical test data, addressing the shortcoming of uncontrollable pressure in ordinary gravity-based probe holders.

The probe support arm can be adjusted in multiple directions, with the arm length and extension angle freely changed. Without moving the sample being tested, it can be aligned with edge electrodes or local micro-area test points. The standard signal connection terminals can directly connect to the source meter, spectral response testing system, and establish I-V testing, photocurrent, and photocurrent response characterization systems. The signal link is simple and stable, meeting the requirements for direct current small-signal acquisition.

The entire machine adopts a high-stiffness aluminum alloy structure with stable mechanical damping. Long-term testing is not prone to needle drift, and beginners can quickly master the pressure adjustment and position alignment. Compared with expensive three-dimensional precision probe holders, the 7-SCF02 retains the advantages of high mobility and adds the function of pressure controllability. It has outstanding cost performance. It is suitable for pre-experiment screening, formal sample electrical testing, teaching and research, especially for the development of films and flexible optoelectronic devices with contact pressure requirements.

From quick positioning to controllable pressure application, the 7-SCF02 removable probe holder fills the performance shortcomings of gravity-based probe holders, balancing efficiency and test accuracy, helping photovoltaic materials and devices obtain real and reproducible experimental data.